2nd INTERNATIONAL CONFERENCE ON
SURFACE METROLOGY
2010
...diverse applications with common interests in the measurement & analysis of topography, texture and roughness - Surfaces cover everything!
25, 26, 27 OCTOBER 2010
The conference will be held on the campus of Worcester Polytechnic Institute, Worcester, Massachusetts, USA
DONATIONS ACCEPTED and SPONSORSHIPS AVAILABLE - see more under News
Objectives:
- Exchange ideas on surface metrology between people with a
diverse set of applications
- Provide educational opportunities at all levels of surface
metrology
- Disseminate advances and insights in surface metrology
fundamentals, methods, equipment, software, and applications.
Intended for:
- Engineers, Scientists, Researchers, Designers, Conservationists,
Technicians and anyone else who is interested in surface roughness and
surface metrology and applications at any level and in any field.
notes:The 1st IC on Surface Metrology in October 2009 was a great success with over 40 technical presentations from 8 countries and over 80 attendees. The presentations explored a wide range of application of surface metrology. Several of the papers will be pbulished in a special issue of Scanning, most of these are already available on line:
www3.interscience.wiley.com/journal/114216512/issue
The 3rd IC on Surface Metrology is planned for October of 2012. It is intended to alternate years with Met Props, the International Conference on Metrology and Properties of Engineering Surfaces.
Met Props 2011 will be 12-14 April 2011 at the National Phyical Laboratory, which is situated 20 km south-west of central London and close to the historic Royal Palace of Hampton Court http://conferences.npl.co.uk/met_prop/.